Semiconductor device and manufacturing method of the same

ABSTRACT

A semiconductor device having a field-effect transistor, including a trench in a semiconductor substrate, a first insulating film in the trench, an intrinsic polycrystalline silicon film over the first insulating film, and first conductivity type impurities in the intrinsic polycrystalline silicon film to form a first conductive film. The first conductive film is etched to form a first gate electrode in the trench. A second insulating film is also formed in the trench above the first insulating film and the first gate electrode, and a first conductivity type doped polycrystalline silicon film, having higher impurity concentration than the first gate electrode is formed over the second insulating film. The doped polycrystalline silicon film is provided in an upper part of the trench to form a second gate electrode.

CROSS REFERENCE AND PRIORITY DATA INFORMATION

This application is a continuation of U.S. Ser. No. 15/001,767, filed onJan. 20, 2016, which is a continuation U.S. Ser. No. 14/690,783, filedon Apr. 20, 2015, which is a continuation of U.S. Ser. No. 14/100,462,filed on Dec. 9, 2012, which, in turn, is a divisional of U.S.application Ser. No. 13/486,738, filed Jun. 1, 2012, which, in turn, isa second Continuation application of U.S. application Ser. No.12/873,495, filed Sep. 1, 2010 (now U.S. Pat. No. 8,232,610), which, inturn, is a Continuation application of U.S. application Ser. No.12/471,680, filed May 26, 2009 (now U.S. Pat. No. 7,834,407), which, inturn, is a Continuation application of U.S. application Ser. No.11/432,491, filed May 12, 2006 (now abandoned), and the contents ofwhich are hereby incorporated by reference into this application. Thisapplication is also related to Ser. No. 13/486,676 (U.S. Pat. No.8,592,920) filed on Jun. 1, 2012, the same date as the presentapplication of the parent application Ser. No. 13/486,738, and whichshares the same inventors and parent applications as Ser. No.13/486,738. The present application claims priority from Japanese patentapplication No. 2005-147914 filed on May 20, 2005, the content of whichis hereby incorporated by reference into this application.

BACKGROUND OF THE INVENTION

The present invention relates to a semiconductor device, and amanufacturing method of the same, and more particularly to a techniquesuitable for application to a power MISFET (Metal InsulatorSemiconductor Field Effect Transistor) having a trench gate structurewith a dummy gate electrode, and a manufacturing method of the same.

A patent document 1, as shown in FIG. 1, discloses a structure having apower MISFET 101 with a trench gate structure, a planar gate type MISFET102, and a protective diode 103 formed on the same substrate. In amethod of manufacturing this structure, a polycrystalline silicon filmincluded in a gate electrode of the power MISFET 101, and apolycrystalline silicon film included in the protective diode 103 areformed independently in different steps. The thickness of thepolycrystalline silicon film constituting the gate electrode is largerthan that of the polycrystalline silicon film included in the protectivediode 103. A source region of the power MISFET 101 and a cathode of theprotective diode are formed in the same step.

A patent document 2 discloses a structure having a planar gate typepower MISFET and a protective diode formed on the same substrate. In amethod of manufacturing this structure, a polycrystalline silicon filmincluded in a gate electrode of the planar gate type power MISFET and apolycrystalline silicon film included in the protective diode are formedin the same step. Also, a source region of the planar gate type powerMISFET and a cathode of the protective diode are formed in the samestep.

A patent document 3 discloses a power MISFET having a trench gatestructure with a dummy gate electrode. In this power MISFET, the dummygate electrode is connected to a source potential.

A patent document 4 discloses another power MISFET having a trench gatestructure with a dummy gate electrode. In this power MISFET, the dummygate electrode is connected to a positive electric potential.

A patent document 5 discloses a further power MISFET having a trenchgate structure with a dummy gate electrode. In this power MISFET, thedummy gate electrode is in a floating state.

[Patent document 1] Japanese Patent Publication No. 3413569

[Patent document 2] Japanese Unexamined Patent Publication No.2000-307109

[Patent document 3] U.S. Pat. No. 5,998,833

[Patent document 4] Japanese Unexamined Patent Publication No. Sho63(1988)-296282

[Patent document 5] Japanese Unexamined Patent Publication No. Hei04(1992)-229662

SUMMARY OF THE INVENTION

A power MISFET (field-effect transistor) having a trench gate structureincludes a gate electrode embedded via a gate insulating film in atrench made on a main surface of a semiconductor substrate. A sourceregion is provided on the top main surface of the semiconductorsubstrate, whereas a drain region is provided on a back surface oppositeto the main surface of the substrate. Between the source region and thedrain region, a channel is formed in a semiconductor region opposed tothe sidewall of the gate electrode disposed in the trench. This causescurrent to pass between the source region and the drain region via thechannel. That is, the power MISFET with the trench gate structure isconfigured to cause the current to pass longitudinally (in a thicknessdirection of the semiconductor substrate).

In recent years, a power MISFET having a trench gate structure with adummy gate electrode has been developed by improving the above-mentionedpower MISFET with the trench gate structure. In this power MISFET havingthe trench gate structure with the dummy gate electrode, the dummy gateelectrode and the gate electrode are laminated in the trench provided inthe main surface of the semiconductor substrate, and are insulated fromeach other with an insulating film provided therebetween. Furthermore,an insulating film is formed between the dummy gate electrode and thetrench, and a gate insulating film is formed between the gate electrodeand the trench. Thus, providing the dummy gate electrode can decreaseparasitic capacitance (feedback capacitance) caused between the gateelectrode and the drain region. That is, the considerable parasiticcapacitance occurs between the gate electrode formed in the trench andthe drain region formed on the back surface of the semiconductorsubstrate. However, the dummy gate electrode is provided between thegate electrode and the drain region, and is connected to the sourcepotential, thus providing a shield effect of decreasing the parasiticcapacitance. Since the shield effect by the dummy gate electrode candecrease the parasitic capacitance between the gate electrode and thedrain region, this MISFET has an advantage that it can achievehigh-speed switching as compared with the conventional power MISFEThaving the trench gate structure without a dummy gate electrode.

When a voltage is applied to the drain region with the gate and thesource region being grounded, the electric field becomes strongest atthe bottom of the trench. Thus, a withstand voltage (BVdss) isdetermined based on a voltage which causes avalanche breakdown in thevicinity of the bottom of the trench. In the power MISFET having thetrench gate structure provided with the dummy gate electrode, an effectof releasing the electric field of the dummy gate electrode can weakenthe electric field at the bottom of the trench, and thus reduce thefrequency of occurrence of the avalanche breakdown in the vicinity ofthe trench. Thus, the power MISFET has an advantage of improving thewithstand voltage (BVdss). For this reason, the power MISFET having thetrench gate structure with the dummy gate electrode has been used. Itshould be noted that the withstand voltage (BVdss) is a breakdownvoltage obtained when a voltage is applied between the source region andthe drain region with the gate electrode and the source regionshort-circuited.

In the power MISFET having the trench gate structure without any dummygate electrodes, even if the performance of the MISFET is intended to beenhanced by thinning the gate insulating film, the defective formationof the gate insulating film is likely to occur at the corner of thebottom of the trench (weak spot) in which the gate electrode isembedded. This fails to thin the gate insulating film. In contrast, inthe power MISFET having the trench gate structure with the dummy gateelectrode, the dummy gate electrode is formed via the insulating film atthe corner of the bottom of the trench. This insulating film is formedmore thickly than the gate insulating film so as to release the electricfield at the bottom of the trench, and thus to improve the withstandvoltage (BVdss). Even the thinned gate insulating film does not allowthe corner of the bottom of the trench to become the weak spot. Thus,the power MISFET having the trench gate structure with the dummy gateelectrode has an advantage that the high performance of the MISFET,including decrease in on-state resistance, can be easily achieved by thethinning of the gate insulating film.

The thinning of the gate insulating film, however, raises a problem thatelectrostatic breakdown resistance of the gate insulating film isdegraded. That is, the thinning of the gate insulating film can achievethe high performance of the MISFET, while disadvantageously resulting indegraded electrostatic breakdown resistance of the MISFET to noise, suchas static electricity (surge).

The need to mount a protective circuit against noise, such as staticelectricity, has been heightened in the power MISFETs for vehicleapplications.

In view of the foregoing problems, it is an object of the invention toprovide a technique for improving the performance of a power MISFEThaving a trench gate structure with a dummy gate electrode, whilepreventing electrostatic breakdown of a gate insulating film therein.

It is another object of the invention to provide a technique formanufacturing the power MISFET having the trench gate structure with thedummy gate electrode, which can easily form a structure for preventingthe electrostatic breakdown of the gate insulating film.

The above-mentioned, and other objects, and new features of theinvention will be apparent to those skilled in the art fromconsideration of the specification and the accompanying drawings.

A brief description of typical aspects according to the inventiondisclosed herein will be given below.

In one aspect of the invention, a semiconductor device comprises afield-effect transistor and a diode that are formed on the samesemiconductor substrate. The semiconductor device includes a drainregion of the field-effect transistor formed on the semiconductorsubstrate, a channel forming region of the field-effect transistorformed on the drain region, and a source region of the field-effecttransistor formed on the channel forming region. The semiconductordevice also includes a trench reaching the drain region from an uppersurface of the source region, a first insulating film formed in thetrench, a first conductive film formed on the first insulating film inthe trench, and a gate insulating film of the field-effect transistorformed over the first conductive film in the trench. Furthermore, thesemiconductor device includes a gate electrode of the field-effecttransistor formed on the gate insulating film in the trench, a secondconductive film made of the same film as the first conductive film, andformed over the semiconductor substrate, and an anode region and acathode region of the diode formed in the second conductive film. Eachof the anode region and the cathode region of the diode is electricallyconnected to the gate electrode or the source region of the field-effecttransistor.

In another aspect of the invention, a semiconductor device comprises (a)a field-effect transistor having a trench gate structure with a dummygate electrode, and (b) a protective diode for protecting thefield-effect transistor from electrostatic breakdown. The field-effecttransistor and the protective diode are formed on the same semiconductorsubstrate.

In a further aspect of the invention, a method of manufacturing asemiconductor device relates to manufacturing of a semiconductor devicewhich includes a field-effect transistor having a trench gate structurewith a dummy gate electrode, and a protective diode for protecting thefield-effect transistor from electrostatic breakdown. In the method, apolycrystalline silicon film for the protective diode included in theprotective diode, and a polycrystalline silicon film for the dummy gateelectrode included in the dummy gate electrode are formed in the samestep. Furthermore, the cathode region of the protective diode and thesource region of the field-effect transistor are also formed in the samestep.

The effects provided by the typical embodiments of the disclosedinvention will be briefly explained below.

Since the power MISFET having the trench gate structure with the dummygate electrode, and the protective diode are formed on the samesemiconductor substrate, the electrostatic breakdown of the gateinsulating film can be prevented, while improving the performance of theMISFET.

The polycrystalline silicon film for the protective diode included inthe protective diode, and the polycrystalline silicon film for the dummygate electrode included in the dummy gate electrode are formed in thesame step. Furthermore, the cathode region of the protective diode andthe source region of the power MISFET having the trench gate structurewith the dummy gate electrode are formed in the same step. This canreduce the complexity of the processing steps, and thus easilymanufacture the power MISFET having the trench gate structure with thedummy gate electrode, and the protective diode.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a sectional view of a structure of a semiconductor devicewhich has been considered by the inventors;

FIG. 2 is a plan view showing a semiconductor device according to onepreferred embodiment of the invention;

FIG. 3 is a sectional view taken along a line A-A of FIG. 2;

FIG. 4 is a sectional view taken along a line B-B of FIG. 2;

FIG. 5 is a diagram showing an example of a circuit which utilizes thesemiconductor device according to the first preferred embodiment;

FIG. 6 is a sectional view showing a manufacturing step of thesemiconductor device according to the embodiment;

FIG. 7 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 6;

FIG. 8 is a plan view showing the manufacturing step of thesemiconductor device according to the embodiment;

FIG. 9 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 7;

FIG. 10 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 9;

FIG. 11 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 10;

FIG. 12 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 11;

FIG. 13 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 12;

FIG. 14 is a plan view showing the manufacturing step of thesemiconductor device according to the embodiment;

FIG. 15 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 13;

FIG. 16 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 15;

FIG. 17 is a plan view showing the manufacturing step of thesemiconductor device according to the embodiment;

FIG. 18 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 16;

FIG. 19 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 18;

FIG. 20 is a plan view showing the manufacturing step of thesemiconductor device according to the embodiment;

FIG. 21 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 19;

FIG. 22 is a plan view showing the manufacturing step of thesemiconductor device according to the embodiment;

FIG. 23 is a sectional view showing a manufacturing step of thesemiconductor device following the step of FIG. 21;

FIG. 24 is a plan view showing an example of a layout structure of thesemiconductor device according to the embodiment; and

FIG. 25 is a plan view showing an example of a layout structure of thesemiconductor device according to the embodiment.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

The following embodiments will be described by being divided into aplurality of sections or embodiments if necessary for convenience.However, unless otherwise specified, they are not irrelevant to oneanother. One of the embodiments has to do with modifications, detailsand supplementary explanations of some or all of the other.

When reference is made to the number of elements or the like (includingthe number of pieces, numerical values, quantity, range, etc.) in thefollowing description of the embodiments, the number thereof is notlimited to a specific number, and may be greater than, or less than, orequal to the specific number, unless otherwise specified and definitelylimited to the specific number in principle.

It is also needless to say that components (including elements orprocess steps, etc.) employed in the following description of theembodiments are not always essential, unless otherwise specified andconsidered to be definitely essential in principle.

Similarly, when reference is made to the shapes, positional relationsand the like of the components or the like in the following descriptionof the embodiments, they will include ones substantially analogous orsimilar to their shapes or the like, unless otherwise specified andconsidered not to be definitely so in principle, etc. This is similarlyapplied even to the above-described numerical values and range.

The preferred embodiments of the invention will be described below indetail based on the accompanying drawings. Note that the same referencenumbers will be used to refer to the same or like parts in principlethroughout all the drawings for explanation of the embodiments, and thusthe repeated description thereof will be omitted. Furthermore, forbetter viewing of the drawings, hatching may be provided even in theplan view.

FIG. 2 is a substantially plan view showing of a semiconductor chip CPaccording to the embodiment of the invention. As shown in FIG. 2, in thecenter of the semiconductor chip CP, is formed a source electrode 24 ofthe power MISFET, a part of which serves as a source pad SP. That is,although not shown in FIG. 2, a polyimide resin film is formed as apassivation film over a main surface of the semiconductor chip CP, and apart of the source electrode 24 is exposed from the polyimide resin filmto form the source pad SP.

A gate interconnection 25 is formed so as to surround the outerperiphery of the source electrode 24. The gate interconnection 25 isalso covered with the polyimide resin film, from which a part of thegate intersection 25 is exposed to form a gate pad GP. The source pad SPand the gate pad GP are connected to bonding wires and the like.

A plurality of n⁺-type semiconductor regions 15 and p⁻-typesemiconductor regions 8 a are formed between the source electrode 24 andthe gate pad GP. That is, a plurality of protective diodes (Zenerdiodes) each made of a pn junction are formed between the sourceelectrode 24 and the gate pad GP. Referring to FIG. 2, two sets of pairsof protective diodes which are connected so as to be oriented indifferent directions from each other (back to back) are formed betweenthe source electrode 24 and the gate pad GP in series. Morespecifically, two sets of pairs of protective diodes, each pairconsisting of anode electrodes (p⁻-type semiconductor regions 8 aserving as an anode region) connected to each other, are connected inseries. Cathode electrodes of one pair of protective diodes (n⁺-typesemiconductor region 15 serving as a cathode region) are connected tothe gate interconnection 25. And, cathode electrodes of the other pairof protective diodes (n⁺-type semiconductor region 15) are connected tothe source electrode 24.

FIG. 3 is a sectional view taken along a line A-A of FIG. 2. As shown inFIG. 3, on a semiconductor substrate 1, an n-type epitaxial layer 2 intowhich n-type impurities are introduced is formed, and a p-type well 3into which p-type impurities are introduced is formed in the n-typeepitaxial layer 2. An element isolation region 4 for separating theelements is formed at a predetermined area on the n-type epitaxial layer2. Particularly, an n-channel-type power MISFET is formed at an activeregion isolated by the element isolation region 4. The p-type well 3 isprovided for formation of the pn junction having a high withstandvoltage, and is connected to a source potential.

The n-channel-type power MISFET includes a source region 14 which is asemiconductor region provided in the n-type epitaxial layer 2, and adrain region consisting of the n-type epitaxial layer 2 and thesemiconductor substrate 1. In the n-type epitaxial layer 2 between thesource region 14 and the drain region, a semiconductor region 13 forformation of a channel (channel forming region) is formed. For example,elements, such as phosphorous (P) or arsenic (As), are introduced orimplanted into the source region 14, and elements, such as boron (B),are introduced or implanted into the semiconductor region 13 for channelformation.

A plurality of trenches 6 extending in a direction perpendicular to themain surface of the semiconductor substrate 1 (in a thickness directionof the semiconductor substrate 1) are formed on the main surface side ofthe substrate 1. The trench 6 penetrates the semiconductor region 13 forchannel formation from the main surface side of the semiconductorsubstrate 1, and ends at the lower part of the n-type epitaxial layer 2.That is, the trench 6 is formed so as to extend from the upper surfaceof the source region 14 to reach the drain region.

In FIG. 3, at the lower part of the inside of each of the two trenches 6as illustrated on the right side of the figure, a dummy gate electrode 9a is formed via an insulating film (first insulating film) 7. At theupper part of the inside of the trench 6, a gate electrode 11 a isformed via a gate insulating film 10. Although the insulating film 7 andthe gate insulating film 10 are made of, for example, a silicon oxidefilm, the thickness of the insulating film 7 is greater than that of thegate insulating film 10. More specifically, the thickness of theinsulating film 7 is, for example, about 200 nm, and the thickness ofthe gate insulating film 10 is, for example, about 50 nm.

The dummy gate electrode 9 a and the gate electrode 11 a are made of,for example, a polycrystalline silicon film having low resistance, andinsulated from each other by an insulating film intervening between thedummy gate electrode 9 a and the gate electrode 11 a. The dummy gateelectrode (made of a first conductive film) 9 a is electricallyconnected to the gate electrode 11 a. That is, in the first embodiment,the dummy gate electrode 9 a and the gate electrode 11 a are set at thesame potential, whereby the withstand voltage of the gate electrode 11 acannot be affected by an insulation resistance of the insulating filmintervening between the dummy gate electrode 9 a and the gate electrode11 a, resulting in improved withstand voltage of the gate electrode 11a. That is, the withstand voltage of the gate electrode 11 a is apt tobe affected by the insulation resistance of the insulating filmintervening between the dummy gate electrode 9 a and the gate electrode11 a. In the first embodiment, however, the dummy gate electrode 9 a andthe gate electrode 11 a with the insulating film sandwiched therebetweenare set at the same potential, so that a voltage load is not applied tothe intervening insulating film, thereby improving the withstand voltageof the gate electrode 11 a.

The gate electrode 11 a is a control electrode of the power MISFET, towhich a voltage for control of the operation of the power MISFET isapplied. The upper surface of the gate electrode 11 a is slightly lowerthan the top part on the main surface side of the semiconductorsubstrate 1 (namely, the upper surface of the source region 14). On theupper surface of the gate electrode 11 a recessed downward, sidewalls 12made of, for example, a silicon oxide film, are embedded. A channel ofthe power MISFET is formed in the semiconductor region 13 for channelformation opposite to the side of the gate electrode 11 a. That is, achannel current of the power MISFET passes along the side of the trench6 in the thickness direction of the semiconductor substrate 1 which isperpendicular to the substrate 1.

In FIG. 3, the trench 6 positioned on the outmost periphery (on the leftside) does not act as the power MISFET, and a lead-out part 9 b for thedummy gate electrode is formed in the trench via the insulating film 7.A lead-out part 11 b for the gate electrode is formed over the lead-outpart 9 b for the dummy gate electrode via the gate insulating film 10.The lead-out part 9 b for the dummy gate electrode is electricallyconnected to the dummy gate electrode 9 a, and the lead-out part 11 bfor the gate electrode is electrically connected to the gate electrode11 a.

Over the main surface of the semiconductor substrate 1, is formed aninterlayer dielectric 16, from which a contact hole (second contacthole) 17 reaching the lead-out part 11 b for the gate electrode isformed. Similarly, a contact hole 18 reaching the semiconductor region13 for channel formation is formed from the interlayer dielectric 16.The contact hole 18 is in contact with the source region 14. Note that,although not shown in FIG. 3, another contact hole (first contact hole)reaching the lead-out part 9 b for the dummy gate electrode from theinterlayer dielectric 16 is formed without being in contact with thelead-out part 11 b for the gate electrode.

The gate interconnection 25 is formed so as to embed the contact hole 17reaching the lead-out part 11 b for the gate electrode from theinterlayer dielectric 16. That is, the lead-out part 11 b for the gateelectrode is electrically connected to the gate interconnection 25.Similarly, the source electrode 24 is formed so as to embed the contacthole 18 reaching the semiconductor region 13 for the channel formationfrom the interlayer dielectric 16. The source electrode 24 and the gateinterconnection 25 are made of a laminate consisting of a barrier metalfilm and a metal film. The barrier metal film is made of, for example, atitanium tungsten (TiW) film 22. The metal film is made of, for example,an aluminum film 23, or an aluminum alloy film.

The source electrode 24 is brought into contact with the source region14 through the side of the contact hole 18 reaching the semiconductorregion 13 for the channel formation. This allows the source electrode 24to be electrically connected to the source region 14. On the bottom ofthe contact hole 18, a p-type semiconductor region 20 is formed, throughwhich the source electrode 24 is electrically connected to thesemiconductor region 13 for the channel formation.

A polyimide resin film 27 is formed as the passivation film over themain surface of the semiconductor substrate 1 with the source electrode24 and the gate interconnection 25 formed thereon. The polyimide resinfilm 27 positioned on the source pad which is a part of the sourceelectrode 24 is removed, which causes the source pad to be exposed tothe outside. A drain electrode 29 is formed on a back surface oppositeto the main surface of the semiconductor substrate 1, and is a laminateconsisting of, for example, a titanium (Ti) film 28 a, a nickel (Ni)film 28 b, and a gold (Au) film 28 c.

The power MISFET of the embodiment is provided with the dummy gateelectrode 9 a, the function of which will be described hereinafter indetail.

In the known power MISFET without the dummy gate electrode 9 a, when avoltage is applied to the drain region with the gate electrode and thesource region being grounded, the electric field becomes strongest atthe bottom of the trench in which the gate electrode is formed. Thus, awithstand voltage (BVdss) of the power MISFET is determined based on avoltage which causes avalanche breakdown in the vicinity of the bottomof the trench. Since there exists only a relatively thin gate insulatingfilm at the bottom of the trench, the electric field intends to becomestrong between the gate and the drain.

In contrast, although in the power MISFET provided with the dummy gateelectrode 9 a such as that shown in FIG. 3, the electric field intendsto become strongest at the bottom of the trench 6 of the dummy gateelectrode 9 a, the presence of the insulating film 7 which is thickerthan the gate insulating film 10 is likely to release the electric filedbetween the dummy gate electrode 9 a and the drain region. This powerMISFET can improve the withstand voltage (BVdss) as compared with thepower MISFET not provided with the dummy gate electrode 9 a.

Furthermore, the provision of the dummy gate electrode 9 a has thefollowing advantages. Generally, in the power MISFET, the gateinsulating film is thinned thereby to improve the performance thereof.However, the power MISFET without the dummy gate electrode 9 a has adisadvantage that the gate insulating film cannot be thinned so much.That is, although in the power MISFET not provided with the dummy gateelectrode 9 a, the gate electrode is formed inside the trench via thegate insulating film, there exists a weak spot at the corner of thetrench where the defective formation of the gate insulating film intendsto occur. This makes it impossible to thin the gate insulating film.

In contrast, in the power MISFET provided with the dummy gate electrode9 a, the dummy gate electrode 9 a is formed via the insulating film 7 inthe lower part of the trench 6, while the gate electrode 11 a is formedvia the gate insulating film 10 in the upper part of the trench 6. Thus,at the corner of the bottom part of the trench 6, not the gateinsulating film 10, but the insulating film 7 is formed. This insulatingfilm 7 is thicker than the gate insulating film 10 in order to improvethe withstand voltage (BVdss). Thus, even if the gate insulating film 10is thinned, the corner of the bottom of the trench does not become aweak spot. As mentioned above, the power MISFET provided with the dummygate electrode 9 a has the advantage that the thinning of the gateinsulating film can improve the performance of the MISFET.

The thinning of the gate insulating film 10 may lead to reduction inelectrostatic breakdown resistance of the gate insulating film 10.However, in the embodiment, the power MISFET provided with the dummygate electrode 9 a and the protective diode connected to this MISFET areformed on the same semiconductor substrate 1. This achieves the thinningof the gate insulating film 10, while ensuring the electrostaticbreakdown resistance of the gate insulating film 10.

FIG. 4 is a section view taken along a line B-B of FIG. 2. As shown inFIG. 4, the power MISFET with the dummy gate electrode 9 a and theprotective diode are formed over the main surface of the semiconductorsubstrate 1. The protective diode is made of the pn junction occurringbetween the p⁻-type semiconductor region 8 a and the n⁺-typesemiconductor region 15. In FIG. 4, the p⁻-type semiconductor regions 8a and the n⁺-type semiconductor regions 15 are formed alternatelybetween the gate interconnection 25 (electrically connected to the gateelectrode 11 a) and the source electrode 24, which forms the fourprotective diodes. These four protective diodes are arranged in two setsof pairs positioned in series, each pair of diodes being connectedtogether so as to be oriented in different directions from each other.

This electric connection of the protective diode between the gateinterconnection 25 and the source electrode 24 can protect the gateinsulating film 10 from the electrostatic breakdown, which will bedescribed hereinafter in more detail. For example, suppose a surgevoltage that exceeds the electrostatic breakdown resistance level of thegate insulating film 10 is applied between the gate interconnection 25and the source electrode 24. At this time, if there is no protectivediode between the gate interconnection 25 and the source electrode 24,the surge voltage exceeding the electrostatic breakdown resistance maybe applied to the gate insulating film 10. As a result, the gateinsulating film 10 may be broken.

In contrast, when the protective diode is connected between the gateinterconnection 25 and the source electrode 24, for example, the surgevoltage causes a reverse bias voltage to be applied to the protectivediode. When the reverse bias voltage caused by the surge voltage exceedsthe breakdown voltage, a breakdown current passes through the protectivediode. At this time, the protective diode is subjected to the breakdownvoltage, which is constant. That is, even when the surge voltage thatexceeds the breakdown voltage is applied to the protective diode, avoltage which has an influence on the protective diode is the constantbreakdown voltage. Thus, the breakdown voltage placed on the protectivediode is also applied to the gate insulating film 10. That is, providingthe protective diode causes only the breakdown voltage by the protectivediode to be applied to the gate insulating film 10, even when the surgevoltage exceeding the dielectric breakdown resistance is applied betweenthe gate interconnection 25 of the power MISFET and the source electrode24. When the breakdown voltage by the protective diode is designed to beset at or below a predetermined value, the gate insulating film 10 canbe protected from the application of the voltage exceeding thedielectric breakdown resistance level.

In the present embodiment, the two sets of pairs of protective diodeswhich are connected so as to be oriented in different directions fromeach other are provided. This formation of the protective diodesconnected to be oriented in different directions from each other isbased on the consideration that the surge voltages the polarities ofwhich are different from each other may be applied. That is, even whenthe surge voltages the polarities of which are different from each otherare applied independently between the gate interconnection 25 of thepower MISFET and the source electrode 24, the protective diode can actnormally. A pair of protective diodes which are connected so as to beoriented in the different direction may have a structure, for example,in which anode electrodes are connected to each other, one cathodeelectrode is connected to the gate interconnection 25, and the othercathode electrode is connected to the source electrode 24. Conversely, apair of protective diodes may have a structure in which cathodeelectrodes are connected to each other, one anode electrode is connectedto the gate interconnection 25, and the other anode electrode isconnected to the source electrode 24.

It should be noted that when the power MISFET is intended to beprotected only from the surge voltage of a specific polarity (forexample, a voltage which causes a positive voltage to be applied to thegate interconnection 25 with respect to the source electrode), the pairof protective diodes oriented in the different direction does not needto be provided, and only one protective diode may be provided. In thiscase, the cathode electrode of the protective diode is connected to thegate interconnection 25, while the anode electrode thereof is connectedto the source electrode 24. Note that, conversely, the cathode electrodeof the diode may be connected to the source electrode 24, and the anodeelectrode thereof connected to the gate interconnection 25.

Although in the embodiment, the two sets of pairs of protective diodesconnected to be oriented in the different directions are formed, theinvention is not limited thereto. This is considered as exemplary only,and contemplated from the viewpoint that an operating voltage of theprotective diode is adjusted to a predetermined value. Therefore, onlyone set of a pair of protective diodes may be used, or a number of, forexample, three or more sets of pairs of protective diodes may beprovided.

Now, an example of a circuit constructed using the power MISFET of theembodiment will be described in detail. FIG. 5 illustrates an example ofa motor control circuit constructed using the power MISFET of theembodiment. The motor control circuit is used as, for example, a circuitfor controlling a motor of a power window device mounted on a vehicle.

Referring to FIG. 5, the motor control circuit includes a gate drivecircuit 30, a motor 31, power MISFETs 32 to 35, a direct current powersupply 36, and protective diodes 37 to 40. In the motor control circuit,gate electrodes of the power MISFETs 32 to 35 are respectively connectedto the gate drive circuit 30. Drain electrodes of the power MISFETs 32and 34 are connected in parallel to a positive electrode of the directcurrent power supply 36. A source electrode of the power MISFET 32 isconnected to a drain electrode of the power MISFET 33, and a sourceelectrode of the power MISFET 34 is connected to a drain electrode ofthe power MISFET 35. A source electrode of the power MISFET 33 and asource electrode of the power MISFET 35 are connected to a negativeelectrode of the direct current power supply 36. The motor 31 isconnected between a connecting part of the power MISFET 32 and the powerMISFET 33, and a connecting part of the power MISFET 34 and the powerMISFET 35. The respective protective diodes 37 to 40 are electricallyconnected between the gate electrodes and the source electrodes of thepower MISFETs 32 to 35. As mentioned above, in the motor control circuitshown in FIG. 5, two sets of pairs of protective diodes (protectivediodes 37 to 40) connected to be oriented in different directions fromeach other (back to back) are connected between the gate electrodes andthe source electrodes of the power MISFETs 32 to 35. The motor controlcircuit is configured to have an H bridge (full bridge) of the powerMISFETs 32 to 35 with respect to the motor 31.

The gate drive circuit 30 is configured to allow for the application ofa predetermined voltage to the gate electrodes of the power MISFETs 32to 35, and to control on/off of the power MISFETs 32 to 35. Each of thepower MISFETs 32 to 35 is the power MISFET having the trench gatestructure with the dummy gate electrode as described with reference toFIGS. 2 to 4, which is the high performance power MISFET including thethinned gate insulating film. The protective diodes 37 to 40 are formedon the same semiconductor substrate as the power MISFETs 32 to 35.

The operation of the motor control circuit according to the embodimentwill be described hereinafter in detail. First, the gate drive circuit30 turns on the power MISFET 33 and the power MISFET 34, and turns offthe power MISFET 32 and the power MISFET 35. Thus, the positiveelectrode of the direct current power supply 36 is connected to aterminal 31 a of the motor 31 via the power MISFET 34. On the otherhand, the negative electrode of the direct current power supply 36 isconnected to a terminal 31 b of the motor 31 via the power MISFET 33.This rotates the motor 31 in a predetermined direction. Next, the gatedrive circuit 30 turns on the power MISFET 32 and the power MISFET 35,and turns off the power MISFET 33 and the power MISFET 34. Then, thepositive electrode of the direct current power supply 36 is connected toa terminal 31 b of the motor 31 via the power MISFET 32. On the otherhand, the negative electrode of the direct current power supply 36 isconnected to a terminal 31 a of the motor 31 via the power MISFET 35.This rotates the motor 31 in a reverse direction from theabove-mentioned direction because the motor is connected reversely withrespect to the connecting condition mentioned above. According to themotor control circuit of the embodiment, the rotating direction of themotor 31 can be controlled.

Suppose a surge voltage which is higher than the breakdown voltage ofthe protective diode 37 is applied to, for example, between the gateelectrode of the power MISFET 32 and the source electrode thereof. Atthis time, the protective diode 37 is connected between the gateelectrode of the power MISFET 32 and the source electrode thereof. Thesurge voltage, which is higher than the breakdown voltage of theprotective diode 37, causes a current to pass through the protectivediode 37 in a reverse direction. When the current passes through theprotective diode 37 in the reverse direction, a voltage to be applied toboth terminals of the protective diode 37 is the constant breakdownvoltage. The breakdown voltage which is lower than the surge voltage isapplied to the gate insulating film of the power MISFET 32. Thus, evenif the surge voltage which may cause dielectric breakdown of the gateinsulating film is applied, the breakdown voltage which may not causethe dielectric breakdown is applied to the gate insulating film becauseof a protection function of the protective diode 37. This can preventthe breakdown of the power MISFET 32.

Now, a manufacturing method of a semiconductor device according to theembodiment will be described in detail with reference to theaccompanying drawings. In the semiconductor device of the embodiment,the power MISFET having the trench gate structure with the dummy gateelectrode and the protective diode are formed on the same semiconductorsubstrate. In manufacturing such a semiconductor device using a normaltechnique, the polycrystalline silicon film for the dummy gateelectrode, the polycrystalline silicon film for the gate electrode, andthe polycrystalline silicon film for the protective diode need to bemanufactured in different respective steps, and the respectivepolycrystalline silicon films should be processed independently. Inorder to mount the protective diode on the semiconductor device, theprocessing step becomes very complicated, and the number ofmanufacturing steps is increased as compared with the case ofmanufacturing only the power MISFET having the trench gate structurewith the dummy gate electrode.

The present embodiment of the invention can achieve simplification ofthe processing steps by employing the following method for manufacturingthe semiconductor device.

In the sectional views as mentioned below, an area on the left sidedesignates the power MISFET forming region, while an area on the rightside designates a protective diode forming region.

First, as shown in FIG. 6, the semiconductor substrate 1 made of n⁺-typesilicon (Si) single crystals having low resistance is prepared on whichthe n-type epitaxial layer 2 made of n-type silicon single crystalshaving high resistance is formed. Subsequently, the p-type well 3 isformed in the n-type epitaxial layer 2, using a photolithographytechnique and an ion implantation method. The p-type well 3 is formed byintroducing p-type impurities, such as boron (B), using the ionimplantation method. This p-type well 3 is formed so as to form the pnjunction having a high withstand voltage. Then, using selectiveoxidation (LOCOS method), for example, the element isolation region 4made of, for example, a silicon oxide film, is formed. In the protectivediode forming region, the p-type well 3 is covered with the elementisolation region 4.

Subsequently, the insulating film 5 made of, for example, a siliconoxide film, is formed over the main surface of the semiconductorsubstrate 1. Although in the embodiment, the silicon oxide film is used,other materials, such as a silicon nitride film (Si₃N₄), may be used.Thereafter, a resist pattern is formed on the insulating film 5, using aseries of photolithography steps, which involves applying a photoresistfilm (hereinafter referred to as a simple “resist film”), exposing, anddeveloping. By etching the insulating film 5 using the resist pattern asan etching mask, and removing the resist pattern, the insulating film 5for formation of the trenches is subjected to patterning. The pattern ofthe insulating film 5 has a function of serving as a hard mask film forformation of the trenches. In the protective diode forming region, theelement isolation region 4 is covered with the insulating film 5.

Then, as shown in FIG. 7, the semiconductor substrate 1 is etched byanisotropic etching using the pattern of the insulating film 5 as anetching mask to form the trenches 6. The trenches 6 are formed in thepower MISFET forming region, but not formed in the protective diode.

FIG. 8 is a plan view of the semiconductor substrate 1 subjected to theabove-mentioned processes. FIG. 8 illustrates a chip region CR of thesemiconductor substrate 1. In FIG. 8, an area surrounded by the elementisolation region 4 is an active area, where the trenches 6 are formed.The sectional view taken along a line C-C of FIG. 8 is a sectional view(see FIG. 6 or the like) showing the power MISFET forming area, whereasthe sectional view taken along a line D-D is a sectional view showingthe protective diode forming area.

Subsequently, as shown in FIG. 9, the semiconductor substrate 1 issubjected to a thermal oxidation process to form the insulating film(first insulating film) 7 made of, for example, a silicon oxide film,over the main surface (including the inner surface of the trench 6) ofthe semiconductor substrate 1. The thickness of the insulating film 7is, for example, about 200 nm.

A polycrystalline silicon film (first polycrystalline silicon film) 8 isformed over the main surface of the semiconductor substrate 1. Thepolycrystalline silicon film 8 is an intrinsic polycrystalline siliconfilm into which conductive impurities are not introduced, which film isformed by, for example, a chemical vapor deposition (CVD) method. Thepolycrystalline silicon film 8 is formed in the power MISFET formingregion as well as in the protective diode forming region. Thepolycrystalline silicon film 8 serves as a polycrystalline silicon filmfor the dummy gate electrode (first conductive film), and as apolycrystalline silicon film for the protective diode (second conductivefilm), as mentioned later. That is, in the first embodiment, thepolycrystalline silicon film for the dummy gate electrode and thepolycrystalline silicon film for the protective diode are simultaneouslyformed as the polycrystalline silicon film 8. This method has anadvantage that it can simplify the process as compared with a case wherethe polycrystalline silicon film for the dummy gate electrode and thepolycrystalline silicon film for the protective diode are independentlyformed in the different steps.

Then, as shown in FIG. 10, p-type impurities, such as boron (B), areintroduced into the polycrystalline silicon film 8 formed over thesemiconductor substrate 1 using the ion implantation method to form ap⁻-type semiconductor region 8 a. Thereafter, as shown in FIG. 11, ahigh concentration of n-type impurities is introduced into the p⁻-typesemiconductor region 8 a of the power MISFET using the photolithographytechnique and the ion implantation method to form an n⁺-typesemiconductor region 8 b. The n-type impurities include, for example,phosphorus (P), arsenic (As), and antimony (└). Subsequently, heattreatment (annealing process) is applied to the semiconductor substrate1 at a temperature of, for example, 1100 degrees (L) or more. This heattreatment is carried out so as to increase a grain size (crystal grainsize) of the polycrystalline silicon film 8 constituting the p⁻-typesemiconductor region 8 a and the n⁺-type semiconductor region 8 b. Asmentioned later, because the grain size of the p⁻-type semiconductorregion 8 a, which is a part of the protective diode, is increased, thep⁻-type semiconductor region 8 a can decrease a leakage current from theprotective diode. This is because the grain size of the semiconductorregion 8 a is increased by high-temperature heat treatment, which leadsto reduction in grain boundary across the pn junction of the protectivediode (a boundary of the crystal grain). That is, since the grainboundary which may be the path of the leakage current, is reduced, theleakage current of the protective diode can be decreased. Thishigh-temperature heat treatment is desirably carried out before formingthe semiconductor region for the channel formation, as mentioned later.If the high-temperature heat treatment were carried out after formingthe semiconductor region for the channel formation, the semiconductorregion for the channel formation would be diffused, thus failing toachieve shallow junction of the channel part, which might be at adisadvantage in enhancing the performance of the power MISFET.

Then, as shown in FIG. 12, the polycrystalline silicon film 8 includingthe n⁺-type semiconductor region 8 b is subjected to patterning usingthe photolithography technique and the etching technique. Thus, thepolycrystalline silicon film 8 formed in the trench 6 is etched up to amid-point of the depth thereof to form the dummy gate electrode 9 a inthe trench 6. The lead-out part 9 b for the dummy gate electrode isformed on the semiconductor substrate 1 by patterning. The lead-out part9 b for the dummy gate electrode 9 a is formed so as to be electricallyconnected to the dummy gate electrode 9 a. At this time, the grain sizeof the polycrystalline silicon film 8 including the n⁺-typesemiconductor region 8 b is increased by the above-mentioned heattreatment. This can effectively prevent the defective formation of thedummy gate electrode 9 a.

Then, as shown in FIG. 13, the insulating film 7 is subjected topatterning by the photolithography and etching techniques. FIG. 14illustrates a plan view of the chip region CR subjected to theabove-mentioned steps. In FIG. 14, in the protective diode formingregion, the p⁻-type semiconductor region (anode region) 8 a is formed,while, in the outer periphery of the power MISFET forming region, thelead-out part 9 b for the dummy gate electrode is formed.

Subsequently, as shown in FIG. 15, the gate insulating film 10 is formedover the main surface of the semiconductor substrate 1 as well as on thesides of the trench 6. The gate insulating film 10 is made of a siliconoxide film formed by, for example, the thermal oxidation process, and isformed so as to be thinner than that of the insulating film 7. This isneeded for improvement of a current drive capability of the powerMISFET, and for decrease in the on-state resistance. The thickness ofthe gate insulating film 10 is, for example, about 50 nm.

The polycrystalline silicon film (second polycrystalline silicon film)is formed over the semiconductor substrate 1 as well as on the gateinsulating film 10. This polycrystalline silicon film is formed by, forexample, the CVD method, with the n-type impurities added thereinto.That is, in forming the polycrystalline silicon film, for example, then-type impurities, such as phosphorus or arsenic, are introduced intothe polycrystalline silicon film. Thereafter, using the photolithographyand etching techniques, the polycrystalline silicon film is subjected topatterning to form the gate electrode 11 a in the trench 6. The gateelectrode 11 a has a recessed structure lower than the top part on themain surface side of the semiconductor substrate 1. By the applicationof patterning to the polycrystalline silicon film, the lead-out part 11b for the gate electrode is formed. The lead-out part 11 b for the gateelectrode is electrically connected to the gate electrode 11 a.

The concentration of the n-type impurities introduced into the gateelectrode 11 a is higher than that of the n-type impurities introducedinto the dummy gate electrode 9 a. In other words, the resistance of thegate electrode 11 a is low as compared with that of the dummy gateelectrode 9 a. This is because the higher resistance of the gateelectrode 11 a makes it difficult for the power MISFETs connected inparallel to act uniformly. That is, if the power MISFETs do not operateuniformly, the electrostatic breakdown resistance of the gate insulatingfilm, and the avalanche resistance may be decreased, and the switchingspeed may become slow disadvantageously. Note that when the power MOS isturned off with the dielectric load being connected, a voltageconsisting of the sum of a power supply voltage and an inducedelectromotive force is instantaneously applied between the source regionand the drain region. When this voltage exceeds the withstand voltage,the device becomes the avalanche breakdown condition. The avalancheresistance means the product of the maximum value of the avalanchecurrent passing through without causing the breakdown, and the time(that is, the avalanche energy) at this time. To prevent suchinconveniences, it is necessary to decrease the resistance of the gateelectrode 11 a. For this reason, in formation of the gate electrode 11a, the polycrystalline silicon film into which impurities, such asphosphorous or arsenic, are previously added, is used. Thepolycrystalline silicon film into which the impurities are previouslyadded can achieve reduction in resistance of the polycrystalline siliconfilm, as compared with the polycrystalline silicon film which is formedwithout addition of the impurities, and then has the impuritiesintroduced by the ion implantation. For example, the polycrystallinesilicon film of 500 nm in thickness to which the impurities arepreviously added can decrease the sheet resistance to about 10Ω/□. Incontrast, the polycrystalline silicon film of 500 nm in thickness intowhich the impurities are introduced by the ion implantation methodcannot decrease the sheet resistance only up to about 20Ω/□. Therefore,the polycrystalline silicon film into which the impurities arepreviously added is used to form the gate electrode 11 a.

On the other hand, the dummy gate electrode 9 a, which is different fromthe gate electrode 11 a of the power MISFET, does not make it difficultfor the power MISFETs connected in parallel to act uniformly even if ithas a higher resistance than that of the gate electrode 11 a. Moreover,since the dummy gate electrode 9 a is covered with the insulating film 7whose thickness is greater than that of the gate insulating film 10, thedummy gate electrode 9 a is likely to ensure the electrostatic breakdownresistance even if the resistance of the dummy gate electrode is higherthan that of the gate electrode 11 a. Therefore, the dummy gateelectrode 9 a can be the polycrystalline silicon film which is made byforming an intrinsic polycrystalline silicon film without addition ofimpurities, and introducing the impurities into the intrinsicpolycrystalline silicon film using the ion implantation method. Itshould be noted that the dummy gate electrode 9 a can be made of thepolycrystalline silicon film into which the impurities are previouslyadded. In the present embodiment, however, since the polycrystallinesilicon film for the protective diode and the polycrystalline siliconfilm for the dummy gate electrode 9 a are simultaneously formed, thepolycrystalline silicon film into which the impurities are previouslyadded cannot be used for the formation of the dummy gate electrode 9 a.That is, in the polycrystalline silicon film into which the impuritiesare previously added, the concentration of the impurities introduced ishigh, and thus the polycrystalline silicon film cannot be used to formthe protective diode. Thus, the polycrystalline silicon film of theprotective diode cannot be formed at the same time when the gateelectrode 11 a is formed using the polycrystalline silicon film with theimpurities previously added thereto. In contrast, since the intrinsicpolycrystalline silicon film can be used in the formation of the dummygate electrode 9 a, the polycrystalline silicon film of the protectivediode can be formed at the same time as that of forming thepolycrystalline silicon film of the dummy gate electrode. For thisreason, in the embodiment, the polycrystalline silicon film for thedummy gate electrode 9 a and the polycrystalline silicon film for theprotective diode are simultaneously formed.

Then, after forming an insulating film (not shown) made of, for example,a silicon oxide film, on the semiconductor substrate 1, a sidewall 12 isformed on an upper part of the trench 6 by the anisotropic etching asshown in FIG. 16. The sidewall 12 is formed so as to protect the cornerof the trench 6 positioned at the upper part thereof. Note that thissidewall may not be formed.

FIG. 17 is a plan view of the chip region CR subjected to the foregoingsteps. As shown in FIG. 17, in the protective diode forming region, thep⁻-type semiconductor region 8 a is formed, and in the outer peripheryof the power MISFET forming region, the lead-out part 9 b for the dummygate electrode is formed. The lead-out part 11 b for the gate electrodeis formed over the lead-out part 9 b for the dummy gate electrode.

Then, a resist pattern is formed over the main surface of thesemiconductor substrate 1 using the photolithography technology suchthat the channel forming region is exposed outward. P-type impurities,such as boron (B), are introduced towards the main surface of thesemiconductor substrate 1 using the resist pattern formed as a mask bythe ion implantation method. Subsequently, after removing the resistpattern, the semiconductor substrate 1 is subjected to a thermaldiffusion process to form the semiconductor region 13 for the channelformation such as that shown in FIG. 18.

Then, another resist pattern is formed over the main surface of thesemiconductor substrate 1 using the photolithography technology suchthat the source forming region and the cathode forming region of theprotective diode are exposed. N-type impurities, such as phosphorous orarsenic, are introduced over the main surface of the semiconductorsubstrate 1 using the resist pattern formed as a mask by the ionimplantation method. Subsequently, after removing the resist patternformed, the semiconductor substrate 1 is subjected to the thermaldiffusion process to form the source region 14 and the n⁺-typesemiconductor region (cathode region) 15 of the protective diode such asthose shown in FIG. 19. Thus, in the embodiment, the source region 14 ofthe power MISFET and the n⁺-type semiconductor region 15 of theprotective diode can be formed simultaneously, which can achievesimplification of the manufacturing steps.

FIG. 20 is a plan view of the chip region CR subjected to theabove-mentioned steps. As shown in FIG. 20, in the protective diodeforming region, the p⁻-type semiconductor region 8 a and the n⁺-typesemiconductor region 15 are formed to create the protective diode havingthe pn junction. As shown in the figure, in the power MISFET formingregion, the source region 14 is formed.

Another reason why the polycrystalline silicon film for the gateelectrode 11 a and the polycrystalline silicon film for the protectivediode are not formed simultaneously, and the polycrystalline siliconfilm for the dummy gate electrode 9 a and the polycrystalline siliconfilm for the protective diode are formed at the same time will bedescribed below.

As shown in FIG. 19, the dummy gate electrode 9 a is filled in thenarrow trench sandwiched between the thick insulating films 7, whereasthe gate electrode 11 a of the power MISFET needs to be filled in thewide trench sandwiched between the thin gate insulating films 10. Thatis, although the dummy gate electrode 9 a and the gate electrode 11 aare formed in the same trench 6, the thick insulating film 7 is formedbetween the dummy gate electrode 9 a and the trench 6. This narrows aregion in which the dummy gate electrode 9 a is filled, by a length ofthe thick insulating film 7 formed. In contrast, since the thin gateinsulating film 10 is formed between the gate electrode 11 a and thetrench 6, the region in which the gate electrode 11 a is filled is widerthan that in which the dummy gate electrode 9 a is filled. Thus, even ifthe thickness of the polycrystalline silicon film forming the dummy gateelectrode 9 a is smaller than that of the polycrystalline silicon filmforming the gate electrode 11 a, the trench 6 can be filled with. Thatis, the thickness of the lead-out part 9 b for the dummy gate electrodeis smaller than that of the lead-out part 11 b for the gate electrode.

More specifically, when the width of the trench 6 is 0.8 μm, thethickness of the insulating film 7 is 200 nm, and the thickness of thegate insulating film 10 is 50 nm, at least the polycrystalline siliconfilm for the dummy gate electrode 9 a may be deposited to a thickness of200 nm or more so that the dummy gate electrode 9 a can be filled in thetrench region having the width of 0.4 μm. In contrast, thepolycrystalline silicon film for the gate electrode 11 a needs to bedeposited to a thickness of 350 nm or more so that the gate electrode 11a is required to be filled in the trench region having a width of 0.7μm.

In forming the protective diode having the n+p⁻ junction, the p⁻-typesemiconductor region 8 a is formed by forming the intrinsicpolycrystalline silicon film, and then implanting the boron ions intothe entire surface of the intrinsic polycrystalline silicon film in adose amount of about 1×10¹³/cm² to 1×10¹⁴/cm². In contrast, the n⁺-typesemiconductor region 15 needs to be selectively formed. The n⁺-typesemiconductor region 15 of the protective diode is formed at the sameion implantation step in which the source region of the power MISFET isselectively formed (at the step of introducing arsenic in an amount ofabout 1×10¹⁵/cm² to 1×10¹⁶/cm²). This can form the protective diodewithout increasing the number of steps.

Now, the junction depth of the source region becomes a major concern. Inorder to enhance the performance of the power MISFET, the shallowjunction of the source region and the channel region is very important.For the shallow junction of the source region, the n⁺-type semiconductorregion 15 of the protective diode simultaneously formed has the junctionin the shallow depth. Thus, if the n⁺-type semiconductor region 15 ofthe protective diode is formed on the thick polycrystalline siliconfilm, the n⁺-type semiconductor region 15 does not reach the bottomsurface of the polycrystalline silicon film readily. When the n⁺-typesemiconductor region 15 does not reach the bottom surface of thepolycrystalline silicon film, a large amount of leakage current passesthrough in the n+p⁻n⁺p⁻n⁺type bidirectional diode. In contrast, if then⁺-type semiconductor region 15 of the protective diode is formed on thethin polycrystalline silicon film, even the thin n⁺-type semiconductorregion 15 can readily reach the bottom surface of the polycrystallinesilicon film, thereby enabling the formation of the protective diodefrom which the leakage current is little.

As mentioned above, even the formation of the thin polycrystallinesilicon film of the protective diode using the polycrystalline siliconfilm for the dummy gate electrode capable of being filled in the trench6 can readily form the n⁺-type semiconductor region 15 of the protectivediode simultaneously at the step of forming the source region of thepower MISFET, which has an advantage in reduction in the number ofsteps. Particularly, this effect is large when the junction at thesource region is shallow to achieve the high performance of the powerMISFET.

Then, as shown in FIG. 21, the interlayer dielectric 16 made of, forexample, a silicon oxide film, is formed over the main surface of thesemiconductor substrate 1. Thereafter, a resist pattern is formed on theinterlayer dielectric 16 by the photolithography technique such that acontact hole forming region is exposed. Subsequently, the interlayerdielectric 16 is etched using the resist pattern formed as an etchingmask, and the resist pattern is removed thereby to form the contactholes 17, 18, and 19 in the interlayer dielectric 16. The contact hole17 reaches the lead-out part 11 b for the gate electrode, and thecontact hole 18 reaches the semiconductor region 13 for the channelformation formed over the main surface of the semiconductor substrate 1.The contact hole 19 is formed in the protective diode forming region,and reaches the n⁺-type semiconductor region 15, which is a cathoderegion of the protective diode.

Then, a part of the semiconductor region 13 for the channel formationexposed to the bottom surface of the contact hole 18 is etched to formthe trench. Thereafter, p-type impurities, such as boron, are introducedinto the bottom of the trench by the ion implantation method to form thep-type semiconductor region 20.

FIG. 22 is a plan view of the chip region CR subjected to theabove-mentioned steps. As shown in FIG. 22, the contact hole 17 isformed in the lead-out part 11 b for the gate electrode, and the contacthole 18 is formed in the active region. The contact hole 19 is formed inthe n⁺-type semiconductor region 15 of the protective diode, and thecontact hole 21 is formed in the lead-out part 9 b for the dummy gateelectrode.

Subsequently, after the titanium tungsten (TiW) film 22 serving as thebarrier metal film is formed over the main surface of the semiconductorsubstrate 1, the aluminum film 23 is formed on the titanium tungstenfilm 22 using, for example, a sputtering method. The titanium tungstenfilm 22 and the aluminum film 23 are subjected to patterning by thephotolithography and etching techniques. This patterning forms thesource electrode 24 consisting of the titanium tungsten film 22 and thealuminum film 23, the gate interconnection 25, and the electrode 26.

The source electrode 24 is formed to fill the contact hole 18, and to beconnected to the source region 14 and the p-type semiconductor region20. The gate interconnection 25 is connected to the lead-out part 11 bfor the gate electrode via the contact hole 17. This lead-out part 11 bfor the gate electrode is connected to the gate electrode 11 a, and thusthe gate interconnection 25 is electrically connected to the gateelectrode 11 a. In the protective diode forming region is formed theelectrode 26, which is connected to the n⁺-type semiconductor region 15via the contact hole 19. One of the electrodes 26 is connected to thesource electrode 24, and the other of the electrodes 26 is connected tothe gate interconnection 25. This arrangement of the electrodes 26connects the protective diode between the source electrode 24 and thegate interconnection 25.

Then, the polyimide resin film (not shown) serving as a passivation filmis formed over the main surface of the semiconductor substrate 1.Thereafter, the polyimide resin film is subjected to patterning usingthe photolithography technique. The patterning is carried out such thata part of the source electrode 24 and a part of the gate interconnection25 are exposed, to form the source pad and the gate pad.

After the back surface of the semiconductor substrate 1 is ground, alaminate consisting of a titanium film (not shown), a nickel film (notshown), and a gold film (not shown) is formed on the entire back surfaceof the substrate 1 using the spattering method, for example. Thus, thedrain electrode made of the laminate, which consists of the titaniumfilm, the nickel film, and the gold film, is formed.

By the above-mentioned steps, the semiconductor device of the embodimentcan be manufactured. According to the embodiment, the power MISFEThaving the trench gate structure with the dummy gate electrode, and theprotective diode are formed on the same semiconductor substrate, therebypreventing the electrostatic breakdown of the gate insulating film,while improving the performance of the MISFET.

The polycrystalline silicon film for the protective diode, included inthe diode, and the polycrystalline silicon film for the dummy electrodeconstituting the dummy gate electrode are formed in the same step.Furthermore, the cathode of the protective diode and the source regionof the power MISFET having the trench gate structure with the dummy gateelectrode are formed in the same step. This can reduce the complexity ofthe processing steps, and thus easily manufacture the power MISFEThaving the trench gate structure with the dummy gate electrode, and theprotective diode.

FIG. 24 illustrates an example of a layout structure of thesemiconductor device according to the embodiment. As shown in FIG. 24,the layout structure includes the dummy gate electrode and the gateelectrode which are electrically connected to each other. In FIG. 24,the contact hole (second contact hole) 17 connected to the lead-out partfor the gate electrode and the contact hole (first contact hole) 21connected to the lead-out part for the dummy gate electrode are arrangedlinearly. On the contact hole 17 and the contact hole 21, which arearranged linearly, the linear gate interconnection 25 is formed. Withthis arrangement, the dummy gate electrode and the gate electrode can beconnected to each other at the same potential. Furthermore, arrangingthe contact hole 17 and the contact hole 21 linearly can increase aneffective area of the semiconductor chip CP (area of a cell formingregion/the entire area of the chip). Note that in FIG. 24, a part of thegate interconnection 25 is omitted so that the contact hole 17 and thecontact hole 21 which are positioned under the gate interconnection 25can be viewed.

Although the contact holes 17 and the contact holes 21 are alternatelyformed as shown in FIG. 24, they do not necessarily need to be arrangedalternately. For example, when the resistance of the gate electrodeintends to be decreased, the rate of the contact holes 17 may desirablybe increased.

FIG. 25 illustrates a layout structure in which the dummy gate electrodeis connected to the source electrode 24, and the gate electrode isconnected to the gate interconnection 25. Connection of the dummy gateelectrode with the source electrode 24 can decrease the parasiticcapacitance (feedback capacitance) between the gate electrode and thedrain region, thereby achieving the high speed switching. That is,although the parasitic capacitance occurs between the gate electrode andthe drain region, connecting the dummy gate electrode formed between thegate electrode and the drain region to the source potential can providethe shield effect. This shield effect can decrease the parasiticcapacitance.

Referring to FIG. 25, the contact holes 17 connected to the lead-outpart for the gate electrode and the contact holes 21 connected to thelead-out part for the dummy gate electrode are arranged linearly. Thecontact hole 17 is connected to the gate interconnection 25, while thecontact hole 21 is connected to the source electrode 24. A part of thegate interconnection 25 which is connected to the contact hole 17 is aconvex part 40 a. A part of the source electrode 24 opposite to theconvex part 40 a is a recessed part 40 b. That is, in a position wherethe source electrode 24 on the contact hole 21 is formed in a recessedshape, the gate interconnection 25 on the contact hole 17 is formed in aconvex shape. In contrast, a part of the source electrode 24 which isconnected to the contact hole 21 is a convex part 41 a. A part of thegate interconnection 25 opposite to the convex part 41 a is a recessedpart 41 b. That is, in a position where the source electrode 24 isformed in a convex shape, the gate interconnection 25 is formed in arecessed shape. With this layout arrangement, the effective area of thesemiconductor chip CP can be increased. Note that in FIG. 25, parts ofthe source electrode 24 and the gate interconnection 25 are omitted sothat the contact holes 17 and the contact holes 21 positioned under thegate interconnection 25 can be viewed.

Although in FIG. 25, the contact holes 17 and the contact holes 21 areformed alternately, they do not necessarily need to be arrangedalternately. For example, when the resistance of the gate electrode isintended to be decreased, the rate of the contact holes 17 may desirablybe increased.

The invention proposed by the inventors has been described based on theexemplary embodiments, and thus the invention is not limited to theembodiments. It should be apparent to those skilled in the art thatvarious modifications and variations may be made without departing fromthe scope of the invention.

The invention can be widely applied to the manufacturing industry ofsemiconductor devices having the power MISFET with the trench gatestructure.

What is claimed is:
 1. A semiconductor device including a semiconductorchip, the semiconductor chip comprising: a field-effect transistorincluding a drain region, a source region, a first gate electrode and asecond gate electrode; and a protective diode, wherein the source regionis electrically connected to one electrode of the protective diode, andwherein the second gate electrode is electrically connected to anotherelectrode of the protective diode.
 2. A semiconductor device accordingto the claim 1, wherein a trench is formed in a semiconductor substrate,wherein a first gate insulating film is formed in the trench anddisposed at a lower part of the trench, wherein the first gate electrodeis formed over the first gate insulating film in the trench and disposedat the lower part of the trench, wherein a second gate insulating filmis formed in the trench and disposed at an upper part of the trench,wherein a second gate electrode is formed over the second gateinsulating film in the trench and disposed at the upper part of thetrench, and wherein a thickness of the first gate insulating film isthicker than a thickness of the second gate insulating film.
 3. Asemiconductor device according to the claim 2, wherein each of the firstgate electrode and the protective diode includes a first polysiliconfilm, and wherein the second gate electrode includes a secondpolysilicon film.
 4. A semiconductor device according to the claim 3,wherein the protective diode is located outside of the trench.
 5. Asemiconductor device according to the claim 4, wherein the firstpolysilicon film is formed of an n-type impurity, wherein the secondpolysilicon film is formed of the n-type impurity, and wherein theprotective diode includes an n-type impurity region and a p-typeimpurity region.
 6. A semiconductor device according to the claim 5,wherein the source region is formed of the n-type impurity, is formed inthe semiconductor substrate and is formed near the upper part of thetrench, and wherein the drain region is formed of the n-type impurity,is formed in the semiconductor substrate and is formed near the lowerpart of the trench.